Semiconductor Structure Cutting Process and Structures Formed Thereby

ABSTRACT

Methods of cutting gate structures, and structures formed, are described. In an embodiment, a structure includes first and second gate structures over an active area, and a gate cut-fill structure. The first and second gate structures extend parallel. The active area includes a source/drain region disposed laterally between the first and second gate structures. The gate cut-fill structure has first and second primary portions and an intermediate portion. The first and second primary portions abut the first and second gate structures, respectively. The intermediate portion extends laterally between the first and second primary portions. First and second widths of the first and second primary portions along longitudinal midlines of the first and second gate structures, respectively, are each greater than a third width of the intermediate portion midway between the first and second gate structures and parallel to the longitudinal midline of the first gate structure.

PRIORITY CLAIM AND CROSS-REFERENCE

This application is a continuation of U.S. application Ser. No.17/085,121, filed on Oct. 30, 2020, entitled “Semiconductor StructureCutting Process and Structures Formed Thereby,” which is a continuationof U.S. application Ser. No. 16/407,730, filed on May 9, 2019, now U.S.Pat. No. 10,833,077 issued Nov. 10, 2020, entitled “SemiconductorStructure Cutting Process and Structures Formed Thereby,” which is adivisional of U.S. application Ser. No. 15/860,492, filed on Jan. 2,2018, now U.S. Pat. No. 10,867,998 issued Dec. 15, 2020, entitled“Semiconductor Structure Cutting Process and Structures Formed Thereby,”which claims the benefit of and priority to U.S. Provisional ApplicationNo. 62/591,898, filed on Nov. 29, 2017, entitled “SemiconductorStructure Cutting Process and Structures Formed Thereby,” each isincorporated herein by reference in its entirety.

BACKGROUND

As the semiconductor industry has progressed into nanometer technologyprocess nodes in pursuit of higher device density, higher performance,and lower costs, challenges from both fabrication and design issues haveresulted in the development of three-dimensional designs, such as a FinField Effect Transistor (FinFET). FinFET devices typically includesemiconductor fins with high aspect ratios and in which channel andsource/drain regions are formed. A gate is formed over and along thesides of the fin structure (e.g., wrapping) utilizing the advantage ofthe increased surface area of the channel to produce faster, morereliable, and better-controlled semiconductor transistor devices.However, with the decreasing in scaling, new challenges are presented.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIGS. 1, 2, 3A-B, 4A-C, 5A-E, 6A-E, 7A-E, 8A-E, 9A-E, 10A-E, 11A-E,12A-E, 13A-E, and 14A-E are various views of respective intermediatestructures at intermediate stages in an example process of forming asemiconductor device including one or more Fin Field Effect Transistors(FinFETs) in accordance with some embodiments.

FIG. 15 is a top view of an example cut opening in accordance with someembodiments.

FIG. 16 is a top view of an example mask with a mask opening for anexample etching process in accordance with some embodiments.

FIG. 17 is a top view of another example mask with a mask opening for anexample etching process in accordance with some embodiments.

FIGS. 18A-B and 19 are various views of respective intermediatestructures at intermediate stages in an example process of forming asemiconductor device including one or more FinFETs in accordance withsome embodiments.

FIG. 20 is a cross-sectional view of a gate cut-fill structure that ismisaligned or overlaid with a conductive feature in accordance with someembodiments.

FIG. 21 is a cross-sectional view of a gate cut-fill structure thatincludes a void in accordance with some embodiments.

FIG. 22 is a layout view of a gate cut-fill structure that includes avoid in accordance with some embodiments.

FIG. 23 is a layout view of another gate cut-fill structure thatincludes a void in accordance with some embodiments.

FIG. 24 is a top view of a cut opening that cuts one replacement gatestructure in accordance with some embodiments.

FIG. 25 is a top view of a cut opening that cuts three replacement gatestructures in accordance with some embodiments.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

Methods of cutting gate structures in a semiconductor device, such asincluding a Fin Field-Effect Transistor (FinFET), and structures formedthereby are described herein. Generally, gate structures, such asreplacement gate structures in a replacement gate process, are cut usingan etching process. The etching process can include an anisotropicetching and an isotropic etching, and the isotropic etching can etchconductive material of the gate structures, e.g., a gate electrode,faster than a dielectric material in a surrounding dielectric layer,such as an interlayer dielectric (ILD), is etched. This etching processcan create a cut opening through the conductive material of the gatestructures that has a profile that has a width between cut sections ofthe gate structures that is greater than a width of the cut opening inthe surrounding dielectric layer. The smaller width of the cut openingin the surrounding dielectric layer may permit a greater distancebetween the cut opening and epitaxy source/drain regions, which canreduce a risk of damage to the epitaxy source/drain regions. Otheradvantages may be realized.

Example embodiments described herein are described in the context ofFinFETs. Implementations of some aspects of the present disclosure maybe used in other processes and/or in other devices, such as planar FETs.Some variations of the example methods and structures are described. Aperson having ordinary skill in the art will readily understand othermodifications that may be made that are contemplated within the scope ofother embodiments. Although method embodiments may be described in aparticular order, various other method embodiments may be performed inany logical order and may include fewer or more steps than what isdescribed herein.

FIGS. 1, 2, 3A-B, 4A-C, and 5A-E through 14A-E are various views ofrespective intermediate structures during intermediate stages in anexample process of forming a semiconductor device including one or moreFinFETs in accordance with some embodiments. In some figures, somereference numbers of components or features illustrated therein may beomitted to avoid obscuring other components or features; this is forease of depicting the figures.

FIG. 1 illustrates, in a cross-sectional view, a semiconductor substrate50. The semiconductor substrate 50 may be or include a bulksemiconductor substrate, a semiconductor-on-insulator (SOI) substrate,or the like, which may be doped (e.g., with a p-type or an n-typedopant) or undoped. Generally, an SOI substrate comprises a layer of asemiconductor material formed on an insulator layer. The insulator layermay be, for example, a buried oxide (BOX) layer, a silicon oxide layer,or the like. The insulator layer is provided on a substrate, typically asilicon or glass substrate. Other substrates, such as a multi-layered orgradient substrate may also be used. In some embodiments, thesemiconductor material of the semiconductor substrate may include anelemental semiconductor such as silicon (Si) and germanium (Ge); acompound semiconductor including silicon carbide, gallium arsenic,gallium phosphide, indium phosphide, indium arsenide, or indiumantimonide; an alloy semiconductor including SiGe, GaAsP, AlInAs,AlGaAs, GaInAs, GaInP, or GaInAsP; or a combination thereof.

FIG. 2 illustrates, in a cross-sectional view, the formation of fins 52in the semiconductor substrate 50. In some examples, a mask (e.g., ahard mask) is used in forming the fins 52. For example, one or more masklayers are deposited over the semiconductor substrate 50, and the one ormore mask layers are then patterned into the mask. In some examples, theone or more mask layers may include or be silicon nitride, siliconoxynitride, silicon carbide, silicon carbon nitride, the like, or acombination thereof, and may be deposited by chemical vapor deposition(CVD), physical vapor deposition (PVD), atomic layer deposition (ALD),or another deposition technique. The one or more mask layers may bepatterned using photolithography. For example, a photo resist can beformed on the one or more mask layers, such as by using spin-on coating,and patterned by exposing the photo resist to light using an appropriatephotomask. Exposed or unexposed portions of the photo resist may then beremoved depending on whether a positive or negative resist is used. Thepattern of the photo resist may then be transferred to the one or moremask layers, such as by using a suitable etching process, which formsthe mask. The etching process may include a reactive ion etch (RIE),neutral beam etch (NBE), inductive coupled plasma (ICP) etch, the like,or a combination thereof. The etching process may be anisotropic.Subsequently, the photo resist is removed in an ashing or wet stripprocesses, for example.

Using the mask, the semiconductor substrate 50 may be etched such thattrenches 54 are formed between neighboring pairs of fins 52 and suchthat the fins 52 protrude from the semiconductor substrate 50. Theetching process may include a RIE, NBE, ICP etch, the like, or acombination thereof. The etching process may be anisotropic.

FIGS. 3A and 3B illustrate, in a cross-sectional view and top view,respectively, the formation of isolation regions 56, each in acorresponding trench 54. The isolation regions 56 may include or be aninsulating material such as an oxide (such as silicon oxide), a nitride,the like, or a combination thereof, and the insulating material may beformed by a high density plasma CVD (HDP-CVD), a flowable CVD (FCVD)(e.g., a CVD-based material deposition in a remote plasma system andpost curing to make it convert to another material, such as an oxide),the like, or a combination thereof. Other insulating materials formed byany acceptable process may be used. In the illustrated embodiment, theisolation regions 56 include silicon oxide that is formed by a FCVDprocess. A planarization process, such as a Chemical Mechanical Polish(CMP), may remove any excess insulating material and any remaining mask(e.g., used to etch the trenches and form the fins 52) to form topsurfaces of the insulating material and top surfaces of the fins 52 tobe coplanar. The insulating material may then be recessed to form theisolation regions 56. The insulating material is recessed such that thefins 52 protrude from between neighboring isolation regions 56, whichmay, at least in part, thereby delineate the fins 52 as active areas onthe semiconductor substrate 50. The insulating material may be recessedusing an acceptable etching process, such as one that is selective tothe material of the insulating material, which may be a wet etchingprocess and/or a dry etching process. Further, top surfaces of theisolation regions 56 may have a flat surface as illustrated, a convexsurface, a concave surface (such as dishing), or a combination thereof,which may result from an etching process. As illustrated in the top viewof FIG. 3B, the fins 52 extend longitudinally across the semiconductorsubstrate 50.

A person having ordinary skill in the art will readily understand thatthe processes described with respect to FIGS. 1 through 3A-B are justexamples of how fins 52 may be formed. In other embodiments, adielectric layer can be formed over a top surface of the semiconductorsubstrate 50; trenches can be etched through the dielectric layer;homoepitaxial structures can be epitaxially grown in the trenches; andthe dielectric layer can be recessed such that the homoepitaxialstructures protrude from the dielectric layer to form fins. In stillother embodiments, heteroepitaxial structures can be used for the fins.For example, the fins 52 can be recessed (e.g., after planarizing theinsulating material of the isolation regions 56 and before recessing theinsulating material), and a material different from the fins may beepitaxially grown in their place. In an even further embodiment, adielectric layer can be formed over a top surface of the semiconductorsubstrate 50; trenches can be etched through the dielectric layer;heteroepitaxial structures can be epitaxially grown in the trenchesusing a material different from the semiconductor substrate 50; and thedielectric layer can be recessed such that the heteroepitaxialstructures protrude from the dielectric layer to form fins. In someembodiments where homoepitaxial or heteroepitaxial structures areepitaxially grown, the grown materials may be in situ doped duringgrowth, which may obviate prior implanting of the fins although in situand implantation doping may be used together. Still further, it may beadvantageous to epitaxially grow a material for an n-type devicedifferent from the material for a p-type device.

FIGS. 4A, 4B, and 4C illustrate, in a cross-sectional view, top view,and perspective three-dimensional view, respectively, the formation ofdummy gate stacks (or more generally, gate structures) on the fins 52.The dummy gate stacks are over and extend laterally perpendicularly tothe fins 52. Each dummy gate stack comprises one or more interfacialdielectrics 60, a dummy gate 62, and a mask 64. The one or moreinterfacial dielectrics 60, dummy gates 62, and mask 64 for the dummygate stacks may be formed by sequentially forming respective layers, andthen patterning those layers into the dummy gate stacks. For example, alayer for the one or more interfacial dielectrics 60 may include or besilicon oxide, silicon nitride, the like, or multilayers thereof, andmay be thermally and/or chemically grown on the fins 52, as illustrated,or conformally deposited, such as by plasma-enhanced CVD (PECVD), ALD,or another deposition technique. A layer for the dummy gates 62 mayinclude or be silicon (e.g., polysilicon) or another material depositedby CVD, PVD, or another deposition technique. A layer for the mask 64may include or be silicon nitride, silicon oxynitride, silicon carbonnitride, the like, or a combination thereof, deposited by CVD, PVD, ALD,or another deposition technique. The layers for the mask 64, dummy gates62, and one or more interfacial dielectrics 60 may then be patterned,for example, using photolithography and one or more etching processes,like described above, to form the mask 64, dummy gate 62, and one ormore interfacial dielectrics 60 for each dummy gate stack.

In the illustrated example, a dummy gate stack is implemented for areplacement gate process. In other examples, a gate-first process may beimplemented using gate stacks including, for example, a gate dielectriclayer in the place of the one or more interfacial dielectrics 60, and agate electrode in the place of the dummy gate 62. In some gate-firstprocesses, the gate stacks may be formed using similar processes andmaterials as described with respect to the dummy gate stacks; althoughin other examples, other processes or materials may be implemented. Forexample, a gate dielectric layer may include or be a high-k dielectricmaterial, such as having a k value greater than about 7.0, which mayinclude a metal oxide or silicate of Hf, Al, Zr, La, Mg, Ba, Ti, Pb,multilayers thereof, or a combination thereof. A gate dielectric layermay also be deposited by molecular-beam deposition (MBD), ALD, PECVD, oranother deposition technique. A gate electrode may also include or be ametal-containing material such as TiN, TaN, TaC, Co, Ru, Al,multi-layers thereof, or a combination thereof, and may also bedeposited by CVD, PVD, or another deposition technique.

In some embodiments, after forming the dummy gate stacks, lightly dopeddrain (LDD) regions (not specifically illustrated) may be formed in thefins 52. For example, dopants for the LDD regions may be implanted intothe fins 52 using the dummy gate stacks as masks. Example dopants forthe LDD regions can include or be, for example, boron for a p-typedevice and phosphorus or arsenic for an n-type device, although otherdopants may be used. The LDD regions may have a dopant concentration ina range from about 10¹⁵ cm⁻³ to about 10¹⁷ cm⁻³.

FIGS. 5A, 5B, 5C, 5D, and 5E illustrate the formation of gate spacers 66along sidewalls of the dummy gate stacks. FIG. 5E illustrates a top viewwith cross-sections A-A, B-B, C, and D. FIG. 5A, and the followingfigures ending with an “A” designation illustrate cross-sectional viewsat various instances of processing corresponding to cross-section A-A.FIG. 5B and the following figures ending with a “B” designationillustrate cross-sectional views at various instances of processingcorresponding to cross-section B-B. FIG. 5C and the following figuresending with a “C” designation illustrate cross-sectional views atvarious instances of processing corresponding to cross-section C. FIG.5D and the following figures ending with a “D” designation illustratecross-sectional views at various instances of processing correspondingto cross-section D. FIG. 5D is a partial cross-sectional viewcorresponding to the cross-sectional views of FIGS. 1, 2, 3A, and 4A atdifferent instances of processing. FIG. 5E is a top view correspondingto the top views of FIGS. 3B and 4B at different instances ofprocessing.

The cross-section A-A is along a fin 52 (e.g., along a channel directionin the fin 52). The cross-section B-B is parallel to cross-section A-Abetween fins 52 and intersects dummy gate stacks where a gate cut willbe made in subsequent figures and description. The cross-section C isacross fins 52 (e.g., in source/drain regions) and is a partialcross-section of the structure illustrated in a top view in FIG. 5E. Thecross-section D is along a dummy gate stack where a gate cut will bemade in subsequent figures and description, and is a partialcross-section of the structure illustrated in a top view in FIG. 5E. Thecross-section D is parallel to cross-section C. Cross-sections A-A andB-B are perpendicular to cross-sections C and D.

Gate spacers 66 are formed along sidewalls of the dummy gate stacks(e.g., sidewalls of the one or more interfacial dielectrics 60, dummygate 62, and mask 64) and over the fins 52. The gate spacers 66 may beformed by conformally depositing one or more layers for the gate spacers66 and anisotropically etching the one or more layers, for example. Theone or more layers for the gate spacers 66 may include or be siliconcarbon oxide, silicon nitride, silicon oxynitride, silicon carbonnitride, the like, multi-layers thereof, or a combination thereof, andmay be deposited by CVD, ALD, or another deposition technique. Theetching process can include a RIE, NBE, or another etching process.

FIGS. 6A, 6B, 6C, 6D, and 6E illustrate the formation of recesses 68 forsource/drain regions. As illustrated, the recesses 68 are formed in thefins 52 on opposing sides of the dummy gate stacks. The recessing can beby an etching process. The etching process can be isotropic oranisotropic, or further, may be selective with respect to one or morecrystalline planes of the semiconductor substrate 50. Hence, therecesses 68 can have various cross-sectional profiles based on theetching process implemented. The etching process may be a dry etch, suchas a RIE, NBE, or the like, or a wet etch, such as usingtetramethyalammonium hydroxide (TMAH), ammonium hydroxide (NH₄OH), oranother etchant.

FIGS. 7A, 7B, 7C, 7D, and 7E illustrate the formation of epitaxysource/drain regions 70 in the recesses 68. The epitaxy source/drainregions 70 may include or be silicon germanium (Si_(x)Ge_(1-x), where xcan be between approximately 0 and 100), silicon carbide, siliconphosphorus, pure or substantially pure germanium, a III-V compoundsemiconductor, a II-VI compound semiconductor, or the like. For example,materials for forming a III-V compound semiconductor include InAs, AlAs,GaAs, InP, GaN, InGaAs, InAlAs, GaSb, AlSb, AlP, GaP, and the like. Theepitaxy source/drain regions 70 may be formed in the recesses 68 byepitaxially growing a material in the recesses 68, such as bymetal-organic CVD (MOCVD), molecular beam epitaxy (MBE), liquid phaseepitaxy (LPE), vapor phase epitaxy (VPE), selective epitaxial growth(SEG), the like, or a combination thereof. As illustrated in FIGS. 7Aand 7C, due to blocking by the isolation regions 56, epitaxysource/drain regions 70 are first grown vertically in recesses 68,during which time the epitaxy source/drain regions 70 do not growhorizontally. After the recesses 68 are fully filled, the epitaxysource/drain regions 70 may grow both vertically and horizontally toform facets, which may correspond to crystalline planes of thesemiconductor substrate 50. In some examples, different materials areused for epitaxy source/drain regions 70 for p-type devices and n-typedevices. Appropriate masking during the recessing or epitaxial growthmay permit different materials to be used in different devices.

A person having ordinary skill in the art will also readily understandthat the recessing and epitaxial growth of FIGS. 6A-E and 7A-E may beomitted, and that source/drain regions may be formed by implantingdopants into the fins 52. In some examples where epitaxy source/drainregions 70 are implemented, the epitaxy source/drain regions 70 may alsobe doped, such as by in-situ doping during epitaxial growth and/or byimplanting dopants into the epitaxy source/drain regions 70 afterepitaxial growth. Example dopants can include or be, for example, boronfor a p-type device and phosphorus or arsenic for an n-type device,although other dopants may be used. The epitaxy source/drain regions 70(or other source/drain region) may have a dopant concentration in arange from about 10¹⁹ cm⁻³ to about 10²¹ cm⁻³. Hence, a source/drainregion may be delineated by doping (e.g., by implantation and/or in situduring epitaxial growth, if appropriate) and/or by epitaxial growth, ifappropriate, which may further delineate the active area in which thesource/drain region is delineated.

FIGS. 8A, 8B, 8C, 8D, and 8E illustrate the formation of one or moredielectric layers 80. The one or more dielectric layers 80 may includean etch stop layer (ESL) and an interlayer dielectric (ILD), forexample. Generally, an etch stop layer can provide a mechanism to stopan etching process when forming, e.g., contacts or vias. An etch stoplayer may be formed of a dielectric material having a different etchselectivity from adjacent layers, for example, the interlayerdielectric. The etch stop layer may be conformally deposited over theepitaxy source/drain regions 70, dummy gate stacks, gate spacers 66, andisolation regions 56. The etch stop layer may comprise or be siliconnitride, silicon carbon nitride, silicon carbon oxide, carbon nitride,the like, or a combination thereof, and may be deposited by CVD, PECVD,ALD, or another deposition technique. The interlayer dielectric may bedeposited over the etch stop layer. The interlayer dielectric maycomprise or be silicon dioxide, a low-k dielectric material (e.g., amaterial having a dielectric constant lower than silicon dioxide), suchas silicon oxynitride, phosphosilicate glass (PSG), borosilicate glass(BSG), borophosphosilicate glass (BPSG), undoped silicate glass (USG),fluorinated silicate glass (FSG), organosilicate glasses (OSG),SiO_(x)C_(y), Spin-On-Glass, Spin-On-Polymers, silicon carbon material,a compound thereof, a composite thereof, the like, or a combinationthereof. The interlayer dielectric may be deposited by spin-on, CVD,FCVD, PECVD, PVD, or another deposition technique.

The one or more dielectric layers 80 are formed with top surface(s)coplanar with top surfaces of the dummy gates 62. A planarizationprocess, such as a CMP, may be performed to level the top surface of theone or more dielectric layers 80 with the top surfaces of the dummygates 62. The CMP may also remove the masks 64 (and, in some instances,upper portions of the gate spacers 66) on the dummy gates 62.Accordingly, top surfaces of the dummy gates 62 are exposed through theone or more dielectric layers 80.

FIGS. 9A, 9B, 9C, 9D, and 9E illustrate the removal of the dummy gatestacks. In other examples in which a gate-first process is implemented,the processing of FIGS. 9A-E and 10A-E (described below) may be omitted.The dummy gates 62 and one or more interfacial dielectrics 60 areremoved, such as by one or more etching processes, to form recesses 82.The dummy gates 62 may be removed by an etching process selective to thedummy gates 62, wherein the one or more interfacial dielectrics 60 actas etch stop layers, and subsequently, the one or more interfacialdielectrics 60 can be removed by a different etching process selectiveto the one or more interfacial dielectrics 60. The etching processes canbe, for example, a RIE, NBE, a wet etch, or another etching process.Recesses 82 are formed between gate spacers 66 where the dummy gatestacks are removed, and channel regions of the fins 52 are exposedthrough the recesses 82.

FIGS. 10A, 10B, 10C, 10D, and 10E illustrate the formation ofreplacement gate structures in the recesses 82 formed by the removal ofthe dummy gate stacks. The replacement gate structures each include agate dielectric layer 90, one or more optional conformal layers 91, anda gate electrode 92. The one or more optional conformal layers 91 mayinclude one or more capping layers, barrier layers, and/or work-functiontuning layers. The gate dielectric layer 90 can be conformally depositedin the recesses 82 where dummy gate stacks were removed (e.g., on topsurfaces of the isolation regions 56, sidewalls and top surfaces of thefins 52 along the channel regions, and sidewalls of the gate spacers 66)and on the top surfaces of the one or more dielectric layers 80 and gatespacers 66. The gate dielectric layer 90 can be or include siliconoxide, silicon nitride, a high-k dielectric material, multilayersthereof, or other dielectric material. A high-k dielectric material mayhave a k value greater than about 7.0, and may include a metal oxide ofor a metal silicate of Hf, Al, Zr, La, Mg, Ba, Ti, Pb, or a combinationthereof. The gate dielectric layer 90 can be deposited by ALD, PECVD,MBD, or another deposition technique.

Then, if implemented, the one or more optional conformal layers 91 maybe conformally (and sequentially, if more than one layer) deposited onthe gate dielectric layer 90. Example capping layers can include or betitanium nitride, titanium-silicon nitride, titanium-carbon nitride,titanium-aluminum nitride, tantalum nitride, tantalum-silicon nitride,tantalum-carbon nitride, aluminum nitride, the like, or a combinationthereof. Example barrier layers can include or be tantalum nitride,tantalum-silicon nitride, tantalum-carbon nitride, tantalum-aluminumnitride, titanium nitride, titanium-silicon nitride, titanium-carbonnitride, titanium-aluminum nitride, aluminum nitride, the like, or acombination thereof. Example work-function tuning layers can include orbe titanium nitride, titanium aluminum carbide, a titanium aluminumalloy, tantalum-aluminum carbide, titanium-silicon nitride,titanium-carbon nitride, titanium-aluminum nitride, tantalum nitride,tantalum-silicon nitride, tantalum-carbon nitride, tungsten nitride,tungsten carbide, tungsten-carbon nitride, cobalt, platinum, the like,or a combination thereof. Each of the one or more optional conformallayers 91 may be deposited by ALD, PECVD, MBD, or another depositiontechnique. Further, different replacement gate structures and/ordifferent sections of a single replacement gate structure can includedifferent work-function tuning layers, which may be for differentperformance features of the different transistors that are to be formed.A gate cut, such as described below, may be made where a transitionoccurs between sections of a replacement gate structure with differentwork-function tuning layers, for example.

A layer for the gate electrodes 92 is formed over the gate dielectriclayer 90, and, if implemented, the one or more optional conformal layers91. The layer for the gate electrodes 92 can fill remaining recesses 82where the dummy gate stacks were removed. The layer for the gateelectrodes 92 may be or comprise a metal-containing material such as W,Co, Ru, Al, Cu. multi-layers thereof, or a combination thereof. Thelayer for the gate electrodes 92 can be deposited by ALD, PECVD, MBD,PVD, or another deposition technique.

Portions of the layer for the gate electrodes 92, one or more optionalconformal layers 91, and gate dielectric layer 90 above the top surfacesof the one or more dielectric layers 80 and gate spacers 66 are removed.For example, a planarization process, like a CMP, may remove theportions of the layer for the gate electrodes 92, one or more optionalconformal layers 91, and gate dielectric layer 90 above the top surfacesof the one or more dielectric layers 80 and gate spacers 66. Thereplacement gate structures comprising the gate electrodes 92, one ormore optional conformal layers 91, and gate dielectric layer 90 maytherefore be formed as illustrated in FIGS. 10A-E.

FIGS. 11A, 11B, 11C, 11D, and 11E illustrate the formation of cutopenings 102 to cut replacement gate structures. In the illustratedexample, a mask 100 (e.g., a hard mask) is used to form the cut openings102. For example, one or more mask layers are deposited over thereplacement gate structures, the gate spacers 66, and the one or moredielectric layers 80, and the one or more mask layers are then patternedto form the mask 100 with mask openings corresponding to the cutopenings 102. In some examples, the one or more mask layers may includeor be silicon nitride, silicon oxynitride, silicon carbide, siliconcarbon nitride, the like, or a combination thereof, and may be depositedby CVD, PVD, ALD, or another deposition technique. The one or more masklayers may be patterned using photolithography and etching processes, aspreviously described. The mask 100 can have the mask openingscorresponding to cut openings 102 extending in a direction laterallyperpendicular to and intersecting the replacement gate structures thatare to be cut. Each mask opening can extend laterally perpendicular toand intersect any number of replacement gate structures that will be cutusing that mask opening, such as one, two, three, or more replacementgate structures.

Using the mask 100, the replacement gate structures, gate spacers 66,and one or more dielectric layers 80 may be etched such that cutopenings 102 are formed cutting the replacement gate structures. The cutopenings 102 extend to a depth through the gate electrodes 92 and, ifimplemented, the one or more optional conformal layers 91. For example,the cut openings 102 can extend to a depth (i) to the correspondingisolation regions 56, (ii) into the corresponding isolation regions 56,and/or (iii) through corresponding isolation regions 56 into thesemiconductor substrate 50. In other examples, such as described belowwith respect to FIGS. 18A-B, the etching process may not completelyremove some components within the cut opening 102.

The etching process includes an anisotropic etching process and anisotropic etching process. The anisotropic etch may etch featuresexposed through the mask openings corresponding to the cut openings 102,such as the one or more dielectric layers 80, gate electrodes 92 and anyconductive layer of the one or more optional conformal layers 91, to apredefined depth. During the isotropic etching process, the isotropicetching process may etch, e.g., including laterally etching, conductivefeatures exposed through the mask openings corresponding to the cutopenings 102, such as the gate electrodes 92 and any conductive layer ofthe one or more optional conformal layers 91, at a rate greater thannon-conductive features are etched. For example, the isotropic etchingprocess may etch the gate electrodes 92 at a rate that is about 1.5 ormore times the rate that the one or more dielectric layers 80 (e.g., theILD) is etched.

In an example, the etching process includes an anisotropic etchingprocess followed by an isotropic etching process, which may furtherinclude one or more cleaning processes. The anisotropic etching processcan include one or more cycles that each includes a passivationdeposition, a passivation break through, a gate etching, and a flashetching.

The passivation deposition can include passivating sidewalls 103 of maskopenings of the mask 100 and any sidewalls of the cut opening 102 thatexist at the time of the passivation deposition. The passivationdeposition can include exposing the structure to a plasma that includesa gas mixture of silicon tetrachloride (SiCl₄), hydrogen bromide (HBr),and helium (He). Other gases may be included in the gas mixture. Byexposing the structure to the plasma, a passivation liner (e.g.,comprising a polymer) can be deposited on surfaces (e.g., sidewalls) ofmask openings and cut openings 102 by byproducts being sputtered tothose surfaces as a result of the exposure.

The passivation break through can include removing the passivation lineron bottom surfaces of the cut openings 102. The passivation breakthrough can include exposing the passivation liner to a plasma thatincludes a gas mixture of carbon tetrafluoride (CF₄) and helium (He).Other gases may be included in the gas mixture.

After the passivation break through, the gate etching can includeetching portions of the gate electrodes 92 and one or more optionalconformal layers 91 that are exposed through the passivation liner. Thegate etching can include exposing the structure to plasma that includesa gas mixture of silicon tetrachloride (SiCl₄), boron trichloride(BCl₃), chlorine (Cl₂), and helium (He). Other gases may be included inthe gas mixture.

After the gate etching, the flash etching can include removing thepassivation liner. The flash etching can include exposing the structureto plasma that includes a gas mixture of methane (CH₄) and oxygen (O₂).Other gases may be included in the gas mixture.

The isotropic etching process may be implemented by an ICP etch or otherprocess. The isotropic etching process can use a gas mixture includingsilicon tetrachloride (SiCl₄) and chlorine (Cl₂). In other examples,other isotropic etching processes and/or other etchants may be used.

A cleaning process may be implemented subsequent to the isotropicetching process. For example, an Electron Cyclotron Resonance (ECR)plasma process using a gas including chlorine (Cl₂) and brominetrichloride (BCl₃) may be implemented, which may remove metal residuefrom the etching process.

FIG. 11E shows the layout profiles of the cut openings 102 formed in theetching process. FIG. 11E does not explicitly depict the mask 100, butillustrates sidewalls 103 (in dashed lines) of mask openings of the mask100. Generally, as FIG. 11E illustrates, each cut opening 102 hasprimary portions each between (e.g., along cross-section D) sections ofa replacement gate structure that is cut by the cut opening 102, and hasan intermediate portion extending between (e.g., along cross-sectionB-B) neighboring primary portions. Additionally, each cut opening 102may have distal portions extending beyond the replacement gatestructures that are cut by the cut opening 102. Each primary portionextends vertically through the gate electrode 92 and the one or moreoptional conformal layers 91 of the respective replacement gatestructure. The primary portion has a width W1 at the top surface of thegate electrode 92 that is cut. Each primary portion electricallyseparates the sections of the gate electrode 92 that is cut by thatprimary portion. The intermediate portion extends vertically through theone or more dielectric layers 80, and extends laterally between theneighboring replacement gate structures that are cut (e.g., alongcross-section B-B) and between epitaxy source/drain regions 70 (e.g.,along cross-section C). The intermediate portion has a width W2 at thetop surface of the one or more dielectric layers 80. The width W1 of theprimary portions is greater than the width W2 of the intermediateportions. FIG. 15 illustrates in more detail an example cut opening 102.

As previously described, the etching process that forms the cut openings102 includes an isotropic etching process that has different etch ratesfor different materials being etched. Since the etch rate of the gateelectrode 92 is greater than the etch rate of, e.g., the one or moredielectric layers 80 (e.g., the ILD), during the isotropic etchingprocess, the cut opening 102 has more of the gate electrode 92 etched toform the greater width W1 than the one or more dielectric layers 80 toform the width W2. The etching process and the resulting cut openings102 can therefore permit a greater amount of the gate electrode 92 andany conductive layer of the one or more optional conformal layers 91 tobe removed while a lesser amount of the one or more dielectric layers 80between neighboring epitaxy source/drain regions 70 is removed. This canincrease a distance D1 between an epitaxy source/drain region 70 and acut opening 102, which can in turn reduce a risk of damage to theepitaxy source/drain region 70 since the one or more dielectric layers80 remains between the epitaxy source/drain region 70 and the cutopening 102. In some examples, the distance D1 is in a range from about5 nm to about 15 nm.

In the cross-section shown in FIG. 11D, the cut opening 102 may havevertical or inclined sidewalls. For example, the cut opening 102 mayhave vertical sidewalls where the width W1 at the top surface of thegate electrode 92 is equal to the width W3 at the bottom of the gateelectrode 92. In other examples, the cut opening 102 may have inclinedsidewalls where the width W1 at the top surface of the gate electrode 92is greater than or less than the width W3 at the bottom of the gateelectrode 92. Similar sidewalls may be formed at other portions of thecut opening 102.

FIGS. 12A, 12B, 12C, 12D, and 12E illustrate the formation of gatecut-fill structures 104 in the cut openings 102. An insulating materialfor the gate cut-fill structures 104 is deposited in the cut openings102 that cut the replacement gate structures. In some examples, each ofthe gate cut-fill structures 104 may be a single insulating material,and in other examples, the gate cut-fill structures 104 may includemultiple different insulating materials, such as in a multi-layeredconfiguration. In some examples, the insulating material may include orbe silicon oxide, silicon nitride, silicon oxynitride, silicon carbide,silicon carbon nitride, the like, or a combination thereof, and may bedeposited by CVD, PVD, ALD, or another deposition technique. The mask100 and portions of the insulating material for the gate cut-fillstructures 104 above the mask 100 are removed. For example, aplanarization process, like a CMP, may remove the portions of theinsulating material for the gate cut-fill structures 104 above the mask100 and may remove the mask 100, and top surfaces of the gate cut-fillstructures 104 may be formed coplanar with the top surface of the one ormore dielectric layers 80. The CMP may further remove upper portions ofthe replacement gate structures, the gate spacers 66, and one or moredielectric layers 80. For example, the CMP may remove the replacementgate structures such that each replacement gate structure has a heightof 20 nm above a top surface of the respective fin 52.

The gate cut-fill structures 104 therefore electrically isolate sectionsof the replacement gate structures that were cut from each other.Further, in some examples, the gate cut-fill structures 104 may act asstressors for the channels of the fins 52, such as when the gatecut-fill structures 104 include or are silicon nitride. This canincrease the channel mobility of the FinFETs that are to be formed.

FIGS. 13A, 13B, 13C, 13D, and 13E illustrate the formation of conductivefeatures 110, such as including contacts, through the one or moredielectric layers 80 to epitaxy source/drain regions 70 of the fins 52.For example, openings may be formed through the one or more dielectriclayers 80 to the epitaxy source/drain regions 70 to expose at leastrespective portions of the epitaxy source/drain regions 70. The openingsmay be formed using, for example, appropriate photolithography andetching processes. An adhesion layer can be conformally deposited in theopenings, such as on the epitaxy source/drain regions 70, and a barrierlayer can be conformally deposited on the adhesion layer, for example.The adhesion layer may be or comprise, for example, titanium, cobalt,nickel, the like or a combination thereof, and may be deposited by ALD,CVD, or another deposition technique. The barrier layer may be orcomprise titanium nitride, titanium oxide, tantalum nitride, tantalumoxide, the like, or a combination thereof, and may be deposited by ALD,CVD, or another deposition technique. Silicide regions may be formed onupper portions of the epitaxy source/drain regions 70 by reacting upperportions of the epitaxy source/drain regions 70 with the adhesion layerand/or barrier layer. An anneal can be performed to facilitate thereaction of the epitaxy source/drain regions 70 with the adhesion layerand/or barrier layer.

Conductive material filling the openings can then be formed. Theconductive material may be or comprise tungsten, copper, aluminum, gold,silver, alloys thereof, the like, or a combination thereof, and may bedeposited by CVD, ALD, PVD, or another deposition technique. After theconductive material is deposited, excess conductive material may beremoved by using a planarization process, such as a CMP, for example.The planarization process may remove excess conductive material, barrierlayer, and adhesion layer from above the top surface of the one or moredielectric layers 80. Hence, top surfaces of the conductive material,barrier layer, adhesion layer, and one or more dielectric layers 80 maybe coplanar. Accordingly, conductive features 110 including theconductive material, barrier layer, adhesion layer, and/or silicideregions may be formed to the epitaxy source/drain regions 70.

FIGS. 14A, 14B, 14C, 14D, and 14E illustrate the formation of one ormore dielectric layers 120 and conductive features 122 in the one ormore dielectric layers 120. The one or more dielectric layers 120 mayinclude an etch stop layer (ESL) and an interlayer dielectric (ILD) orintermetallization dielectric (IMD), for example. The etch stop layermay be deposited over the one or more dielectric layers 80, conductivefeatures 110 in the one or more dielectric layers 80, gate cut-fillstructures 104, etc. The etch stop layer may comprise or be siliconnitride, silicon carbon nitride, silicon carbon oxide, carbon nitride,the like, or a combination thereof, and may be deposited by CVD, PECVD,ALD, or another deposition technique. The interlayer dielectric orintermetal dielectric may be deposited over the etch stop layer. Theinterlayer dielectric or intermetal dielectric may comprise or besilicon dioxide, a low-k dielectric material, such as siliconoxynitride, PSG, BSG, BPSG, USG, FSG, OSG, SiO_(x)C_(y), Spin-On-Glass,Spin-On-Polymers, silicon carbon material, a compound thereof, acomposite thereof, the like, or a combination thereof. The interlayerdielectric or intermetal dielectric may be deposited by spin-on, CVD,FCVD, PECVD, PVD, or another deposition technique.

Recesses and/or openings can be formed in and/or through the one or moredielectric layers 120 where the conductive features 122 are to beformed. The one or more dielectric layers 120 may be patterned with therecesses and/or openings, for example, using photolithography and one ormore etching processes. The conductive features 122 may then be formedin the recesses and/or openings. The conductive features 122 may includea barrier layer and conductive material formed on the barrier layer, forexample. The barrier layer can be conformally deposited in the recessesand/or openings and over the one or more dielectric layers 120. Thebarrier layer may be or comprise titanium nitride, titanium oxide,tantalum nitride, tantalum oxide, the like, or a combination thereof,and may be deposited by ALD, CVD, or another deposition technique. Theconductive material may be or comprise tungsten, copper, aluminum, gold,silver, alloys thereof, the like, or a combination thereof, and may bedeposited by CVD, ALD, PVD, or another deposition technique. After thematerial of the conductive features 122 is deposited, excess materialmay be removed by using a planarization process, such as a CMP, forexample. The planarization process may remove excess material of theconductive features 122 from above a top surface of the one or moredielectric layers 120. Hence, top surfaces of the conductive features122 and the one or more dielectric layers 120 may be coplanar. Theconductive features 122 may be or may be referred to as conductivelines, contacts, vias, etc. As illustrated, the conductive features 122are formed to the conductive features 110 formed in the one or moredielectric layers 80 or replacement gate structures to electricallycouple the epitaxy source/drain regions 70 or the replacement gatestructures, respectively. The layout of the conductive features in thefigures is merely an example. A person having ordinary skill in the artwill readily understand that a layout of conductive features can differbetween different implementations.

FIG. 15 illustrates a top view of an example cut opening 102 inaccordance with some embodiments. For example, FIG. 15 illustrates a topview of a cut opening 102 of FIG. 11E. In a plane parallel to the topsurface of, e.g., the one or more dielectric layers 80, the cut opening102 has different widths at different materials or components that thecut opening 102 intersects. For example, in the illustrated cut opening102, the cut opening 102 has smallest widths A (in a plane at the topsurface of the one or more dielectric layers 80) where the cut opening102 intersects gate spacers 66. Further, in the illustrated cut opening102, the cut opening 102 has largest widths B (in a plane at the topsurface of the one or more dielectric layers 80) at the primary portionsof the cut opening 102 where the cut opening 102 intersects gateelectrodes 92. Similarly, in the illustrated cut opening 102, the cutopening 102 has medium widths C (in a plane at the top surface of theone or more dielectric layers 80), e.g., larger than the smallest widthsA and less than the largest widths B, at the intermediate portion wherethe cut opening 102 intersects the one or more dielectric layers 80(e.g., the ILD).

As described above with respect to FIGS. 11A through 11E, the isotropicetching process that is used to form the cut opening 102 can havedifferent etch rates for different materials of the structure beingetched. The gate spacers 66, and possibly, the gate dielectric layer 90,are etched during the isotropic etching process at a first etch rateER1. The one or more dielectric layers 80 are etched during theisotropic etching process at a second etch rate ER2. The gate electrode92, and possibly, one or more optional conformal layers 91, are etchedduring the isotropic etching process at a third etch rate ER3. The firstetch rate ER1 is less than the second etch rate ER2, and the second etchrate ER2 is less than the third etch rate ER3. The smallest widths A mayoccur due to the first etch rate ER1 during the isotropic etching (e.g.,the etch rate of the gate spacers 66, and possibly, the gate dielectriclayer 90) being lower than the second etch rate ER2 and the third etchrate ER3. The largest widths B may occur due to the third etch rate ER3during the isotropic etching (e.g., the etch rate of the gate electrode92, and possibly, one or more optional conformal layers 91) beinggreater than the first etch rate ER1 and the second etch rate ER2. Themedium widths C may occur due to second etch rate ER2 during theisotropic etching (e.g., the etch rate of the one or more dielectriclayers 80) being less than the third etch rate ER3 and greater than thefirst etch rate ER1.

The proximity of different materials of different components can causethe different widths A, B, and C and can cause curved surfaces of thecut opening 102 between the widths A, B, and C (e.g., curved convexsurfaces of the intermediate and primary portions). Lateral etchingcomponents of the isotropic etching of the etching process may bereduced near the gate spacers 66 where the first etch rate ER1 of theisotropic etching is the lowest because the lower first etch rate ER1 ofthe gate spacers 66 may cause a rate of exposure of adjoining materialsto the isotropic etching of the etching process to be reduced. This cancause the isotropic etching to cause a “bulge” in the primary portions(e.g., at width B) at the respective midlines of the gate electrodes 92.Similarly, this can cause the isotropic etching of the etching processto cause another “bulge” in the intermediate portion (e.g., at width C)in the one or more dielectric layers 80 at a midway between neighboringgate spacers 66, for example.

In some examples, a ratio of the largest width B to the smallest width Ais in a range from about 2.5:1 to about 1.5:1; a ratio of the mediumwidth C to the smallest width A is in a range from about 2:1 to about1.2:1; and a ratio of the largest width B to the medium width C is in arange from about 2.5:1 to about 1.4:1. In some examples, the smallestwidth A is in a range from about 5 nm to about 22 nm; the medium width Cis in a range from about 5 nm to about 28 nm; and the largest width B isin a range from about 12 nm to about 28 nm.

Although the examples of FIG. 15 and subsequent figures are illustratedand described in the context of certain components having certainfeatures, other embodiments may have other and/or additional componentsthat have those and/or additional features. For example, someembodiments can include an etch stop layer that has a lowest etch rateduring the isotropic etching of the etching process. In other examples,the gate dielectric layer 90 may have a lowest etch rate during theisotropic etching of the etching process. In these examples, the widthsof the cut opening may vary from the illustrated cut opening 102 in FIG.15.

FIG. 16 illustrates a top view of an example mask 200 with a maskopening 202 corresponding to a cut opening 204 for the etching processof FIGS. 11A-E in accordance with some embodiments. The mask opening 202in the mask 200 is rectangular in a plane of the top surface of the mask200, and can result, in conjunction with the etching process, in the cutopening 204, such as previously described. In other examples, the maskopening 202 in the mask 200 is rectangular with rounded corners or isoval in a plane of the top surface of the mask 200.

FIG. 17 illustrates a top view of an example mask 210 with a maskopening 212 corresponding to a cut opening 218 for the etching processof FIGS. 11A-E in accordance with some embodiments. The mask opening 212in the mask 210 includes end sections 214 and a constricted midsection216. The end sections 214 in a plane of the top surface of the mask 200are each rectangular with a width, and the constricted midsection 216 isdisposed between the end sections 214 and is rectangular with a widththat is less than the width of the end sections 214. The end sections214 can be positioned directly over gate electrodes 92 that are to becut by the etching process of FIGS. 11A-E while the constrictedmidsection 216 can be positioned between epitaxy source/drain regions70. The mask opening 212 in the mask 210 can result, in conjunction withthe etching process, in the cut opening 218, such as previouslydescribed. The mask opening 212 in the mask 210 can cause the ratio ofthe largest widths B to the medium widths C in the cut opening 218 ofFIG. 17 to be larger than the ratio of the largest widths B to themedium widths C in the cut opening 204 of FIG. 16.

FIGS. 18A and 19 illustrate cross-sectional views, and FIG. 18Billustrates a top view, of an intermediate structure during intermediatestages in an example process of forming a semiconductor device inaccordance with some embodiments. In previous examples, such as in FIG.11B, the etching process removed the gate spacers 66 and the gatedielectric layer 90 within the profile of the cut opening 102, andetched to the isolation region 56 that was directly under thosestructures. In the illustrated example of FIGS. 18A and 18B, a portionof the gate spacers 66′ and a portion of the gate dielectric layer 90′remain within a cut opening 300 after the etching process of FIGS.11A-11E. In FIGS. 18A and 18B, the gate electrode 92 and any conductivelayer of the one or more optional conformal layers 91 are removed fromthe cut opening 300 to electrically separate or isolate the sections ofthe gate electrode 92 that was cut by the cut opening 300. The cutopening 300 may have characteristics and features previously describedfor other cut openings. In the example of FIGS. 18A and 18B, however,the etching process used to form the cut opening 300 may have an etchrate and time that removes the gate electrode 92 and any conductivelayer of the one or more optional conformal layers 91 and does notremove the portions of the gate spacers 66′ and portion of the gatedielectric layer 90′.

FIG. 19 illustrates the formation of a gate cut-fill structure 302 inthe cut opening 300. An insulating material for the gate cut-fillstructure 302 is deposited in the cut opening 300 that cut thereplacement gate structures. In some examples, the gate cut-fillstructure 302 may be a single insulating material, and in otherexamples, the gate cut-fill structure 302 may include multiple differentinsulating materials, such as in a multi-layered configuration. The gatecut-fill structure 302 may be formed as described with respect to FIGS.12A-12E. The gate cut-fill structure 302 therefore electrically isolatessections of the replacement gate structures that were cut from eachother. Further, the gate cut-fill structure 302 may encapsulate theportions of the gate spacers 66′ and portion of the gate dielectriclayer 90′ that remain in the cut opening 300.

FIG. 20 illustrates a cross-sectional view of a gate cut-fill structure400 that is misaligned or overlaid with a conductive feature 110 inaccordance with some embodiments. The gate cut-fill structure 400 may beformed according to the formation of the gate cut-fill structure 104 inFIGS. 1 through 13A-E. The cross-section of FIG. 20 corresponds with thecross-section of FIG. 13C, for example. With respect to FIG. 20, themask opening in the mask that is used to etch the cut opening for thegate cut-fill structure 400 may be misaligned between the epitaxysource/drain regions 70. This can result in a conductive feature 110being formed in direct contact with the gate cut-fill structure 400.This contact between the conductive feature 110 and the gate cut-fillstructure 400 may, in some instances, not affect the operability of thedevice since the gate cut-fill structure 400 is an insulating structure.

FIG. 21 illustrates a cross-sectional view of a gate cut-fill structurethat includes a void 502 in accordance with some embodiments. Inpreviously described embodiments, the gate cut-fill structures arecompletely filled with one or more solid insulating material. In otherembodiments, such as illustrated in FIG. 21, the gate cut-fill structureincludes a void 502, which may be a vacuum or include a gas. The gatecut-fill structure also includes an insulating liner 500 that isconformal in the cut opening. The void 502 may extend substantially thelength of the cut opening (e.g., through the length except for portionsat ends where a thickness of the insulating liner 500 is on therespective sidewall of the cut opening), as illustrated in a layout viewin FIG. 22. In other examples, one or more voids 502 may be at variouslocations in the insulating liner 500, and the insulating liner 500 mayseparate multiple voids 502. For example, as illustrated in a layoutview in FIG. 23, wider portions of a gate cut-fill structure, such asthe primary portions, have a void 502, while narrower portions of thegate cut-fill structure are filled with the insulating liner 500.Further, in some devices, different gate cut-fill structures may havediffering corresponding widths, and hence, some gate cut-fill structuresmay have voids, such as illustrated in FIGS. 22 and 23, while other gatecut-fill structures may be filled with a solid insulating material.

Embodiments described previously have been described in the context of acut opening cutting two neighboring replacement gate structures. Inother embodiments, any number of replacement gate structures can be cutby a cut opening. For example, FIG. 24 illustrates in a top view a cutopening 600 that cuts one replacement gate structure (e.g., includingone gate electrode 92). Further, FIG. 25 illustrates in a top view a cutopening 602 that cuts three replacement gate structures (e.g., eachincluding one gate electrode 92). From the various illustratedembodiments, a person having ordinary skill in the art will readilyunderstand a pattern that may be repeated by a cut opening extendingthrough multiple replacement gate structures. The cut openings 600 and602 may be formed as previously described, for example, with a maskopening through a mask intersecting the appropriate replacement gatestructures to be cut, and subsequently, performing an etching process tocut those replacement gate structures.

Some embodiments may achieve advantages. For example, a cut opening canhave a width between neighboring epitaxy source/drain regions that isless than a width between sections of a gate structure that has beencut. This can permit the cut opening to be spaced at a greater distancefrom the epitaxy source/drain regions while permitting sufficientetching of the gate structure. The greater distance between the cutopening and epitaxy source/drain regions can reduce a risk that theepitaxy source/drain regions are damaged during the etching process thatforms the cut opening. This can increase the yield of structures formedwith a gate cut process. Further, the formation, and resulting profile,of a cut opening can increase a process window for forming a conductivefeature to a neighboring epitaxy source/drain region, and/or canincrease the pattern density of the device.

An embodiment is a structure. The structure includes a first active areaon a substrate, a first gate structure over the first active area, asecond gate structure over the first active area, and a gate cut-fillstructure. The first active area includes a first source/drain region.The first gate structure extends longitudinally parallel to the secondgate structure, and the first source/drain region is disposed laterallybetween the first gate structure and the second gate structure. The gatecut-fill structure has a first primary portion, a second primaryportion, and a first intermediate portion. The first primary portionabuts the first gate structure. The second primary portion abuts thesecond gate structure. The first intermediate portion extends laterallyfrom the first primary portion to the second primary portion. The firstprimary portion has a first width, and the first width is along alongitudinal midline of the first gate structure. The second primaryportion has a second width, and the second width is along a longitudinalmidline of the second gate structure. The first intermediate portion hasa third width, and the third width is midway between the first gatestructure and the second gate structure and is parallel to thelongitudinal midline of the first gate structure. The first width isgreater than the third width, and the second width is greater than thethird width.

Another embodiment is a method. A first gate structure and a second gatestructure are formed over a first active area and a second active areaon a substrate. The first gate structure extends longitudinally over thefirst active area and the second active area, and the second gatestructure extends longitudinally over the first active area and thesecond active area. A dielectric layer is disposed laterally between thefirst gate structure and the second gate structure and over the firstactive area and the second active area. A cut opening is formedlaterally disposed between the first active area and the second activearea. The cut opening has a first primary portion, a second primaryportion, and an intermediate portion. The first primary portion isthrough at least a gate electrode of the first gate structure. Thesecond primary portion is through at least a gate electrode of thesecond gate structure. The intermediate portion extends laterally fromthe first primary portion to the second primary portion and is in thedielectric layer. The first primary portion has a first width, and thefirst width is along a longitudinal midline of the first gate structure.The second primary portion has a second width, and the second width isalong a longitudinal midline of the second gate structure. Theintermediate portion has a third width, and the third width is midwaybetween the first gate structure and the second gate structure and isparallel to the longitudinal midline of the first gate structure. Thefirst width is greater than the third width, and the second width isgreater than the third width. A gate cut-fill structure is formed in thecut opening.

A further embodiment is a method. A first gate structure and a secondgate structure are formed over a first active area and a second activearea on a substrate. The first gate structure extends longitudinallyover the first active area and the second active area, and the secondgate structure extends longitudinally over the first active area and thesecond active area. A dielectric layer is disposed laterally between thefirst gate structure and the second gate structure and over the firstactive area and the second active area. An etch process is performed onthe first gate structure, the second gate structure, and the dielectriclayer laterally between the first active area and the second active areato form a cut opening. The etch process etches through at least gateelectrodes of the first gate structure and the second gate structure.The etch process includes an isotropic etch. The isotropic etch etchesthe gate electrodes of the first gate structure and the second gatestructure at a first etch rate. The isotropic etch etches the dielectriclayer at a second etch rate. The first etch rate is greater than thesecond etch rate. An insulating material is formed in the cut opening.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

1.-20. (canceled)
 21. A structure comprising: a first fin protrudingfrom a substrate; a second fin protruding from the substrate; a firstgate structure extending over the first fin; a second gate structureextending over the second fin, the first gate structure and the secondgate structure being longitudinally aligned; a first gate spacer along asidewall of the first gate structure; a second gate spacer along asidewall of the second gate structure; a first dielectric layer along asidewall of the first gate spacer; a second dielectric layer along asidewall of the second gate spacer; and a gate cut-fill structurebetween the first gate structure and the second gate structure, the gatecut-fill structure being between the first gate spacer and the secondgate spacer, the gate cut-fill structure being between the firstdielectric layer and the second dielectric layer, wherein a first widthof the gate cut-fill structure between the first gate spacer and thesecond gate spacer is less than a second width of the gate cut-fillstructure between the first gate structure and the second gatestructure, wherein a third width of the gate cut-fill structure betweenthe first dielectric layer and the second dielectric layer is greaterthan the first width of the gate cut-fill structure between the firstgate spacer and the second gate spacer.
 22. The structure of claim 21,wherein the gate cut-fill structure comprises a multi-layered insulatingstructure.
 23. The structure of claim 22, wherein the multi-layeredinsulating structure comprises layers of different materials.
 24. Thestructure of claim 21, further comprising a third dielectric layer overthe gate cut-fill structure, wherein one or more voids extend from abottom surface of the third dielectric layer into the gate cut-fillstructure.
 25. The structure of claim 24, wherein at least one void ofthe one or more voids is between the first gate structure and the secondgate structure.
 26. The structure of claim 24, wherein at least one voidof the one or more voids is between the first dielectric layer and thesecond dielectric layer.
 27. The structure of claim 21, wherein asmallest width of the gate cut-fill structure is between the first gatespacer and the second gate spacer.
 28. A structure comprising: a firstgate structure and a second gate structure extending along a first line;a third gate structure and a fourth gate structure extending along asecond line; a first gate spacer along a sidewall of the first gatestructure; a second gate spacer along a sidewall of the second gatestructure; a third gate spacer along a sidewall of the third gatestructure; a fourth gate spacer along a sidewall of the fourth gatestructure; a first source/drain region interposed between the first gatestructure and the third gate structure; a second source/drain regioninterposed between the second gate structure and the fourth gatestructure; a first dielectric layer over the first source/drain regionand the second source/drain region; a gate cut-fill structure betweenthe first gate structure and the second gate structure, the gatecut-fill structure being between the first gate spacer and the secondgate spacer, the gate cut-fill structure being between the third gatespacer and the fourth gate spacer, the gate cut-fill structure extendingthrough the first dielectric layer between the first source/drain regionand the second source/drain region, wherein a width of the gate cut-fillstructure extending through the first dielectric layer is less than awidth of the gate cut-fill structure between the first gate structureand the second gate structure, wherein the width of the gate cut-fillstructure extending through the first dielectric layer is less than awidth of the gate cut-fill structure between the third gate structureand the fourth gate structure; a second dielectric layer over the firstdielectric layer and the gate cut-fill structure; and a first voidbetween the second dielectric layer and the gate cut-fill structure. 29.The structure of claim 28, wherein a width of the gate cut-fillstructure between the first gate spacer and the second gate spacer isless than the width of the gate cut-fill structure extending through thefirst dielectric layer.
 30. The structure of claim 29, wherein a widthof the gate cut-fill structure between the third gate spacer and thefourth gate spacer is less than the width of the gate cut-fill structureextending through the first dielectric layer.
 31. The structure of claim28, further comprising a second void between the second dielectric layerand the gate cut-fill structure.
 32. The structure of claim 28, whereinthe first void is between the first gate structure and the second gatestructure.
 33. The structure of claim 28, wherein the first void isbetween opposing sidewalls of the first dielectric layer.
 34. Thestructure of claim 28, wherein the gate cut-fill structure comprises aplurality of insulating layers.
 35. A structure comprising: a first gatestructure over a first fin; a second gate structure over a second fin,wherein the first gate structure and the second gate structure extendalong a first line; a first gate spacer along a sidewall of the firstgate structure; a second gate spacer along a sidewall of the second gatestructure; a first dielectric layer over the first fin; a seconddielectric layer over the second fin; and a gate cut-fill structurebetween the first gate structure and the second gate structure, the gatecut-fill structure being between the first gate spacer and the secondgate spacer, the gate cut-fill structure being between the firstdielectric layer and the second dielectric layer, wherein a width of thegate cut-fill structure between the first dielectric layer and thesecond dielectric layer is greater than a width of the gate cut-fillstructure between the first gate spacer and the second gate spacer in aplan view.
 36. The structure of claim 35, further comprising a thirddielectric layer over gate cut-fill structure, the first dielectriclayer, and the second dielectric layer, wherein the gate cut-fillstructure has a non-planar upper surface such that a void is disposedbetween the non-planar upper surface of the gate cut-fill structure anda bottom surface of the second dielectric layer.
 37. The structure ofclaim 36, wherein the void is between the first gate structure and thesecond gate structure.
 38. The structure of claim 36, wherein the voidis between the first dielectric layer and the second dielectric layer.39. The structure of claim 35, wherein the first gate spacer isconnected to the second gate spacer.
 40. The structure of claim 35,wherein the gate cut-fill structure comprises a plurality of insulatinglayers, wherein an upper surface of the gate cut-fill structure is levelwith an upper surface of the first dielectric layer.